Testing for Reliability: Test Item Analysis on a TOEIC Listening test
Speaker: Paul Hackshaw
Date: Friday, April 26th, 2002
Time: 7:00 PM - 8:30 PM
Location: Kyoto
Venue: Kyoto Kyoiku Bunka Center, Marutamachi, Sakyo-ku
Description:
This presentation describes Paul Hackshaw's small-scale Item Test Response analysis conducted on the TOEIC test. The study examines how university students performed on a section of the TOEIC listening test. Hackshaw examined the fairness of individual items in the test and calculated the test's reliability. He observed 54 students in his TOEIC class,and analysed their scores on a twenty item listening test. He investigated the correlation between the difficulty of individual items and the measured ability of the students, their ranking based on their performance on the test. In some cases there was some variation between the questions and their ability, among the three groups. Hackshaw plans to show some examples of poorly written test items during the presentation.
Cost for JALT members: free Cost for JALT non-members: 1000 yen Organization: Kyoto Chapter, Kyoto Chapter of the Japan Association for Language Teaching This URL: http://www.eltcalendar.com/events/details/632
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